Industrial
Chamber for Memory Environmental Test System (High-Speed Aging BI)
The DHT® Chamber for Memory Environmental Test System (High-Speed Aging BI) is an advanced aging test solution specifically developed for semiconductor memory devices such as DRAM and NAND. It is widely used by chip manufacturers, tester vendors, and memory R&D institutions.
Models such as the DHT-H5620 and DHT-AF8652 integrate both burn-in (BI) and core testing capabilities. These systems support an ultra-wide temperature range from -40°C to 150°C, provide ±0.4°C high uniformity temperature control, and enable multi-channel parallel testing, delivering a stable and efficient solution for high-speed, high-volume memory testing demands.
Benefits
Intelligent Data Analysis: Equipped with a proprietary algorithm library developed over years of experience, the system analyzes aging data in real-time and optimizes testing parameters, thereby reducing false positives and minimizing rework costs.
Stable Reliability and Easy Maintenance Design: Constructed with high-precision mechanical components, the system supports rapid loading and unloading of chips, reducing manual intervention and achieving a stability rate of 99.98%. Key components, such as heating modules and sensors, are independently replaceable, shortening maintenance time by 50% and ensuring continuous production line operation.
Extended Temperature Range and Precision Control: Surpassing the industry standard of -10°C to 125°C, this system supports standard testing from -20°C to 125°C, with an optional extended range of -40°C to 150°C, enabling comprehensive reliability validation of memory devices under extreme environmental conditions. Temperature uniformity has been enhanced from the typical 3°C to a precise range of 0.4°C to 2.0°C, ensuring consistent and reliable test data.
Efficient Parallel Testing and Scalability: Featuring flexible slot configurations, the system supports modular expansion to 24, 34, 48, or more slots, accommodating various DRAM and NAND chip testing requirements. This scalability meets the diverse needs of servers, mobile devices, and other applications.
High-Speed Burn-In Testing Technology: Capable of performing parallel aging tests at frequencies up to 10 MHz across multiple boards, significantly reducing testing cycles. The integration of Burn-In (BI) and Core testing processes minimizes equipment transitions, enhancing overall efficiency by over 30%.
Integrated Testing and Cost Optimization: The DHT-H5620 consolidates aging and functional testing, reducing both capital investment and operational costs. It also allows for the execution of test programs during the aging process, facilitating early detection of defective chips.